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Home - EMI / EMC / RFI Test Systems
EN61000-4-6 / ENV50141

Conducted RF Immunity Test System

Description:

Verify the immunity of electronic equipment, single devices or systems (including their cables) against radiated interference by replacing a direct test with a disturbance field by an equivalent indirect test with a conducted disturbance. This current is the same that would be induced by the disturbance field.

Application:

A current injection probe or clamp is used to inductively couple a stimulus into power and I/O cables, while the EUT is monitored and evaluated for results against performance criterion selected. The stimulus is applied in the frequency range from 150 kHz  to 80MHz, with a step size of 1% of fundamental.

Test System consists of the following components:

HP / Agilent 8648A Synthesized Signal Generator

Signal Generator: 150 kHz to 80 MHz with 1 kHz rate AM modulation to 80%

HP / Agilent EPM-441A

HP / Agilent EPM-441A Single Ch. Power Meter

Power Meter System to calibrate stimulus level


IFI SCCX100 Solid State Amplifier

Amplifier: 150 kHz to 80 MHz

Bird 100-A-MFN-06

Bird 100-A-MFN-06 6 dB Attenuator

Isolation Attenuator

Fischer Custom Communications / FCC F-120-9A

Fischer Custom Communications / FCC
F-120-9A Bulk Current Injector Probe / Clamp

Injection Probe

 

Dressler CDN-AF4

Dressler CDN-AF4 Coupling / Decoupling Network

Coupling / Decoupling Network (Optional)

 

Interconnecting Cables and Adapters

System Diagram

Please contact us for more information on Conducted RF Immunity Test Systems

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